In today's ever-changing high-tech world, the semiconductor industry, as the cornerstone of information technology, has a direct relationship with the precision and efficiency of its manufacturing process, which is directly related to the performance and cost of its products. In order to meet the growing demand for semiconductor quality inspection, POMEAS has introduced an innovative variable-magnification navigational observation solution, which is playing an increasingly important role in the semiconductor industry due to its significant advantages in observation range, accuracy and ease of use.


The zoom navigation observation program is a comprehensive solution that combines a high-precision zoom lens, advanced image processing technology and intelligent navigation algorithms. Its core lies in the flexible adjustment of the observation range through the motorized zoom lens, combined with automatic focusing and image enhancement technology to ensure that clear and stable images can be obtained at different magnifications. Meanwhile, the intelligent navigation algorithm can automatically adjust the observation position according to the preset path or real-time instructions, realizing efficient and accurate observation.


1. Microstructure observation: with the continuous progress of semiconductor processes, the structure on the chip is getting smaller and smaller in size, which puts forward higher requirements for the resolution and magnification of the observation equipment.
2. Defect detection difficulty: defects on the wafer may be manifested as tiny scratches, contamination or structural deformation, these defects are difficult to find under conventional observation, requiring high precision and high sensitivity detection means.
3. Efficient production needs: semiconductor production line has a very high demand for inspection speed, how to ensure the quality of the inspection while improving the inspection efficiency, is a major problem faced by the semiconductor industry.
Through the motorized zoom lens, the zoom navigation observation solution is able to flexibly switch between different magnifications to achieve comprehensive observation from macro to micro. In large field of view mode, the surface of the wafer can be quickly scanned to find potential defect areas; in detail capture mode, the observation area can be zoomed in at high magnification to accurately identify the type and size of defects.
Combined with advanced image processing technology and intelligent navigation algorithms, the variable navigation observation solution is capable of high-precision measurement and positioning. Whether it is the measurement of tiny structure dimensions on wafers or the precise positioning of defect locations, it can achieve extremely high accuracy requirements and provide reliable data support for semiconductor manufacturing.
The variable-magnification navigation observation solution supports the automated observation process, which can automatically adjust the observation position and magnification according to the preset procedures or real-time commands, realizing unattended automated inspection. Meanwhile, the intelligent algorithm can automatically analyze, classify and record defect information according to the observation results, which greatly improves the inspection efficiency and accuracy.
With the continuous progress of semiconductor processes and the rapid development of intelligent manufacturing, variable navigation observation solutions will play a more important role in the semiconductor industry. POMEAS will continue to dedicate to technology innovation and solution optimization to provide more efficient, accurate and intelligent observation solutions for the semiconductor industry, and to promote semiconductor manufacturing in the direction of higher quality and higher efficiency.
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