The white light interferometer has become a key tool for studying the surface characteristics of new materials, coatings, and films, thanks to its three core advantages: nanometer-level resolution, non-contact measurement, and full-field 3D imaging. Unlike traditional contact probes or optical microscopes, it operates on the principle of low-coherence interferometry. This enables precise capture of surface microtopography, geometric parameters, and mechanically related properties without damaging the sample. It provides quantitative data support for fundamental research and applied development in materials science, tribology, coating technology, and related fields, addressing the scientific challenges of “invisibility, measurement inaccuracy, and reproducibility issues.”

The POMEAS White Light Interferometric Profilometer has become the preferred choice for numerous universities, research institutes, and corporate R&D departments due to its superior technical adaptability and research-grade stability. Equipped with a next-generation low-coherence interferometry module and intelligent algorithms, it enables higher-precision parameter quantification and more efficient full-range scanning, perfectly meeting the stringent measurement demands of new material development.

Core Application Scenarios: Quantitative Analysis Focused on Three Major Research Directions

(I) Materials Science: Correlation Studies Between Surface Microstructure and Properties

The surface characteristics of new materials—such as roughness, porosity, and microscopic protrusions/indentations—directly determine their core functionalities, including mechanical properties, wettability, and biocompatibility. White-light interferometers support research by:

• Precise 3D Topography Reconstruction: For new materials such as polymers, ceramic-matrix composites, and metal alloys, it quantitatively characterizes surface parameters including Ra (arithmetic mean roughness), Rz (maximum height), and Sa (surface roughness), establishing a correlation model between “microtopography and macroscopic properties.” The POMEAS white-light interferometric profilometer supports 5nm vertical resolution and 1000×1000 pixel full-field scanning. Paired with proprietary 3D topography reconstruction software, it rapidly generates high-fidelity surface models and directly exports standardized data reports suitable for publication. For instance, in biomedical material research, it enables real-time monitoring of surface structural changes under different fabrication processes, providing precise data support for optimizing cell adhesion efficiency.

• Pore and Defect Quantitative Analysis: For porous materials and nanocomposites, it accurately measures pore size, distribution density, and defect depth, providing data support for optimizing material breathability and mechanical strength. POMEAS's global scanning technology covers sample areas up to 100mm×100mm. Combined with intelligent defect recognition algorithms, it automatically quantifies pore and defect counts and distribution patterns, eliminating the randomness of traditional localized measurements and ensuring statistical significance of research data.

(II) Tribology: Dynamic Tracking and Mechanism Analysis of Surface Wear Behavior

In tribological research, wear volume, wear morphology, and friction interface evolution serve as core observational metrics. The non-contact nature of white light interferometers renders them an ideal tool for dynamic wear studies:

• Precise Quantification of Wear Volume: By comparing the 3D surface topography of samples before and after friction, key parameters such as wear volume and wear depth are calculated. This eliminates errors caused by sample adsorption and oxidation inherent in traditional weight-based methods, making it particularly suitable for micro-nano scale wear studies (e.g., MEMS devices, precision coatings). The POMEAS White Light Interferometric Profilometer features a “One-Click Pre/Post-Wear Comparison” function that automatically calculates core parameters like wear volume difference and maximum wear depth. With measurement repeatability error ≤0.1%, it delivers reliable data for evaluating the tribological properties of materials like high-temperature alloys and wear-resistant coatings.

• Visual analysis of wear mechanisms: Clearly displays surface topography features (e.g., scratches, spalling pits, crack propagation paths) corresponding to different mechanisms like abrasive wear, adhesive wear, and fatigue wear, helping researchers uncover material wear mechanisms. Equipped with ultra-high depth-of-field imaging technology, POMEAS clearly captures microscopic details on worn surfaces. Combined with multidimensional data analysis modules, it rapidly correlates wear morphology with material formulations and process parameters, accelerating the R&D iteration of wear-resistant materials.

(III) Coating Technology: Stringent Quality Control and Optimization of Uniformity and Adhesion

The uniformity, thickness consistency, and adhesion of coatings directly impact their protective properties (such as corrosion resistance and wear resistance) and service life. White light interferometers provide comprehensive quantitative solutions:

• Coating Thickness and Uniformity Measurement: Utilizing reflective interferometry principles, it precisely measures the thickness of single-layer or multi-layer coatings (measuring range from nanometers to micrometers) and generates thickness distribution heatmaps through full-field scanning. The POMEAS White Light Interferometer supports automatic thickness differentiation measurement for single-layer/ multi-layer coating thicknesses. It incorporates dedicated measurement models for metal, ceramic, and polymer coatings, achieving thickness measurement accuracy of ±1nm. The system generates intuitive thickness distribution heatmaps and statistical reports, enabling timely detection of coating defects such as missed areas, localized over-thickness, or under-thickness. This provides precise data for optimizing process parameters in spraying, sputtering, and deposition techniques.

   

• Coating Adhesion and Failure Analysis: Through surface morphology observation after scratch and peel tests, quantify the peel area and delamination depth to evaluate the bond strength between the coating and substrate. POMEAS' high-speed scanning mode captures full-surface morphology data within 3 minutes, detecting early failure signals like coating cracking and delamination. Its data interfaces directly with material mechanics analysis software, providing quantitative support for refining coating formulations (e.g., adding coupling agents) and optimizing substrate pretreatment processes.

• Targeted Analysis of Special Coatings: For special coating types such as transparent coatings and flexible coatings, POMEAS can achieve non-destructive thickness and topography characterization by adjusting the interference optical path and measurement modes (e.g., transmission interference, specialized fixtures for flexible samples). This overcomes the measurement limitations of traditional methods on special coatings. For instance, in studying transparent protective coatings for flexible electronic devices, it enables precise measurement of coating thickness and flatness without damaging the flexible substrate.

(IV) Thin Film Technology: Precise Capture of Stress Deformation and Microstructural Defects

Thin film materials (such as semiconductor films, optical films, and flexible electronic films) are extremely thin (typically ranging from nanometers to micrometers in thickness). They are susceptible to internal stresses generated during the fabrication process, which can lead to deformation such as warping and cracking. A white light interferometer can achieve:

• Stress-Induced Deformation Quantification: By measuring film warpage and bending radius, combined with material mechanical models, we reverse-engineer the magnitude and distribution of internal stresses within the film. The POMEAS White Light Interferometric Profilometer features a built-in stress calculation module. Simply input parameters such as the elastic modulus and Poisson's ratio of the film and substrate, and it automatically determines the internal stress distribution with measurement accuracy reaching ±0.1μm/m. For instance, in semiconductor photoresist film research, this enables precise control of film flatness to prevent pattern distortion during lithography, providing data support for optimizing deposition temperatures and annealing processes.

• Micro-Defect Detection: Captures micro- and nano-scale defects on film surfaces, including pinholes, scratches, and particle contamination, quantifying defect size, density, and distribution. POMEAS' intelligent defect detection algorithm automatically identifies microdefects ≥50nm in diameter, statistically analyzes defect density and size distribution, and generates defect location maps. This provides a basis for cleanliness control and process optimization in thin film fabrication, particularly for fields demanding extreme defect sensitivity like semiconductor films and optical anti-reflective coatings.

• Optical Performance Correlation Analysis: Establishes quantitative correlation models by integrating surface roughness and flatness data with optical performance metrics like reflectance and transmittance. POMEAS simultaneously outputs surface roughness (Sa, Sq, etc.), flatness (PV, RMS, etc.), and thickness uniformity data, enabling researchers to rapidly correlate film microstructure with optical properties. This accelerates the design and fabrication of high-performance optical films. 

Scientific Value: Driving the “Data-Driven” Upgrade in Materials Research and Development

The application of white light interferometers in new materials, coatings, and thin film research delivers core value by enabling a leap from “qualitative description” to “quantitative analysis,” from “local observation” to “global characterization,” and from “destructive testing” to “non-contact, non-destructive evaluation.” Among these, POMEAS' white light interferometer further amplifies this value through technological innovation: its intelligent interface lowers the learning curve for researchers, supports automatic data export and compatibility with multiple software platforms (such as Origin and Matlab), enabling direct use for presenting data in papers and writing research reports. Additionally, POMEAS offers customized measurement solutions, upgrading equipment configurations to meet specialized research demands (e.g., high-temperature samples, oversized specimens, dynamic measurements in extreme environments). Examples include providing high-temperature measurement modules for aerospace material coating research and dynamic deformation tracking capabilities for flexible electronic film studies.

The high-precision, repeatable, and visualizable data it delivers not only validates research hypotheses and uncovers intrinsic patterns in material surface properties but also accelerates R&D iteration cycles. For instance, in coating formulation optimization, it enables rapid comparison of uniformity and wear resistance across different formulations, shortening development timelines. In new material performance evaluation, it precisely quantifies critical surface parameters, providing reliable scientific evidence for industrial material applications.