Product News

The Application of Line Laser Sensors in the Thickness Measurement of Lithium-Ion Battery Electrodes

Line laser sensor thickness measurement solutions have become the mainstream choice for lithium-ion electrode thickness inspection, thanks to their combination of high precision, full-width coverag......

2026/08/25

author:POMEAS

Image measuring instrument: Dial gauge measurement of minute components

The high-precision Image 3 Pro-H image measuring system, equipped with a spectrometer for height measurement and professional fixtures that provide a reference surface, facilitates the measurement ......

2026/08/19

author:POMEAS

Detection of Chipping Defects in Fibre-Optic Components

A microscopic imaging solution utilising the optical components of a ZOOM LENS not only provides a rapid solution to the problem of detecting notches in optical fibres, but also allows for horizont......

2026/08/18

author:POMEAS

How to choose the right telecentric lens for vision systems?

When selecting a telecentric lens, it is necessary to consider resolution, working distance, field of view, aperture and the specific parameters of the compatible camera to ensure that the lens mee......

2026/08/17

author:POMEAS

What is a high-resolution telecentric lens?

A high-resolution telecentric lens is an optical lens specifically designed to preserve the shape and proportions of the projected object; it is suitable for applications such as visual measurement......

2026/08/14

author:POMEAS

Integrated Measurement and Sorting: A Case Study of Online 100 per cent Inspection of Round Bars

A Telecentric Measurement System picks up round rods for measurement, whilst a compact SCARA loader places pass or fail products into their respective zones according to instructions, thereby achie......

2026/08/13

author:POMEAS

How can microscopic systems be used to improve accuracy in wafer inspection?

Thanks to its high-resolution imaging and autofocus capabilities, the microscopy system can accurately identify minute defects on wafers, such as cracks, particulate contamination or etching issues....

2026/08/12

author:POMEAS

How to resolve measurement issues with mobile phone lens grinding and cutting

The IMAGE 3, a high-precision desktop image measurement system equipped with a dual telecentric optical system and intelligent edge-detection algorithms, can perform precise measurements of the com......

2026/08/12

author:POMEAS

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