Telecentric Measurement System projects the contour of the measured object through a high-precision green LED parallel light source, and the CMOS sensor at the receiving end works with the Telecentric Measurement System to completely eliminate the parallax effect of traditional optical measurement. Even if the position of the workpiece is shifted by ±5mm, the contour image still maintains zero distortion and the dimensional measurement value remains constant.

Telecentric Measurement System integrates more than 100 intelligent measurement tools, covering geometric parameters (concentric circles/angles/arcs) and form and positional tolerances (true roundness/straightness), and equipped with adaptive edge-grabbing algorithms, which can automatically identify complex edges such as metal reflective surfaces and rubber burrs. For multi-species production scenarios, the device supports millisecond program switching, seamlessly adapting to different product specifications.

Provides 40/65/120mm three-step measurement field of view, the highest resolution of 1μm, repeatability accuracy stabilized at 0.08μm. Widely used in precision bearings, semiconductor packaging, medical devices and other fields, to achieve 24-hour on-line full inspection, the measurement rate of up to 0.3 seconds/feature item.