Spectral Confocal Sensor SFS-D8055

Spectral Confocal Sensor SFS-D8055 Thickness Measurement Solution

1. Program components: dual probes work in tandem to calculate the thickness of an object by emitting beams of different wavelengths and receiving reflected light, using the principle of spectral shift. Advantage: non-contact measurement, avoiding wear and tear or deformation caused by contact between the probes and the object to be measured. Real-time, can dynamically monitor the thickness changes on the production line. Dual probe design can offset part of the environmental interference (such as vibration, temperature fluctuation), to enhance the stability of measurement.

2. Software: with CCS spectral measurement software can real-time data acquisition and processing, generate thickness curves or reports. Support parameter calibration (e.g. zero point, range) and error compensation to optimize measurement accuracy. Compatible with a variety of communication protocols (e.g. USB, Ethernet), easy to integrate into automated production line systems.

Spectral Confocal Sensor SFS-D8055 Application Scenarios

1. Industrial manufacturing: on-line thickness monitoring of metal sheets, plastic films, paper coatings.

2. Semiconductors and electronics: wafer coating, PCB board insulation layer thickness detection. 

3. Scientific research and quality control: thickness analysis of multilayer structure in material science research, accuracy verification in quality control.

The minimum object thickness that can be accurately measured by the spectral probe SFS-D8055, below which measurement accuracy may be compromised. It is suitable for thickness monitoring of thicker materials such as plates and multi-layer structures.