From 9 to 11 September 2026, the 27th China International Optoelectronics Expo (CIOE) will open its doors at the Shenzhen International Convention and Exhibition Centre (Bao’an). POMEAS will be making a major appearance with its four core product ranges, bringing laboratory-grade precision measurement capabilities to the exhibition floor. We invite you to experience the results of our measurements first-hand and discuss bespoke testing solutions with us in person.

Exhibition dates: 9–11 September

Stand number: 1A75

Venue: Shenzhen International Convention and Exhibition Centre

What cutting-edge exhibits is POMEAS bringing to this trade fair?

✅ Measurement Systems Series

We offer high-precision image measurement systems and 3D white-light interferometric profilometers, delivering stable measurements with micrometre-level accuracy. These systems meet the requirements for non-contact dimensional and contour inspection of optical components, semiconductor devices and precision parts, and we can provide on-site demonstrations using actual samples.

✅ Sensor Solutions Series

The exhibition will showcase Telecentric Measurement Systems, point-spectral alignment solutions and the Focus X autofocus system, all specifically designed for high-speed inspection scenarios on industrial production lines. These solutions are tailored to meet the requirements for in-line dimensional measurement and alignment guidance across multiple industries, including 3C electronics, photovoltaics and lithium-ion batteries, helping companies to automate and upgrade their production line quality control processes.

✅ Microscope Series

This newly upgraded motorised zoom autofocus microscope is equipped with a proprietary autofocus algorithm, eliminating the need for manual calibration throughout the entire zoom range and significantly improving observation efficiency in industrial inspection and materials analysis applications.

✅ Optical Components Solutions Series

On-site demonstrations of 4K lenses and 14X lenses were set up to provide a visual comparison of imaging performance and detail resolution at different magnifications, offering guidance on lens selection for applications such as machine vision and precision optical inspection.