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3D White Light Interference Profiler

The POMEAS 3D White Light Interference Profiler is capable of “in-plane” measurements with better than nanometer resolution and non-contact measurement of sample surface topography without damaging...

Optics General Catalog

Products

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        POMEAS 3D white light interferometric profilers are capable of “in-plane” measurements with better than nanometer resolution, non-contact measurement of sample surface topography without damaging the product itself. WLI-1000 is widely used in optics, semiconductors, materials, precision machinery and other fields for surface texture and microstructure analysis.

 

 

 

 

Product Features

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1. Roughness measurements characterizing microscopic morphology;

2, step height, angle and other contour size measurement;

3, automatic focus, automatic stripe finding, automatic brightness adjustment and other automated auxiliary functions;

4, leveling, image retouching, denoising and filtering, regional extraction and other data processing functions;

5, comparative analysis and multi-document analysis and other auxiliary analysis functions.

 

 

Areas of application

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Product Parameters

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PRODUCT RECOMMENDATION

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