Difference between 3D white light interference profiler and 3D profiler




There is a wide variety of measuring devices in industrial inspection, and there are many similarities between measuring devices and measuring devices before, such as 3D white light interference profilers and 3D profilers. In this paper, we will go through the working principle, practical application and measurement accuracy in the differences between the two.




3D White Light Interference Profiler: works based on the principle of white light interference. It utilizes the light emitted from the light source to form two beams after passing through specific optical elements, one beam is reflected by the measured surface and the other beam is reflected by the reference mirror, and these two beams finally converge and interfere. By measuring the changes in the interference fringes, the three-dimensional shape of the object surface can be accurately measured.


3D Profiler: A number of different technical principles are used, including but not limited to structured light, laser triangulation, phase difference, etc. These techniques acquire three-dimensional information about the surface of an object in different ways.



Practical Applications:


3D White Light Interference Profilometer: Due to its high precision and non-contact measurement characteristics, it is particularly suitable for precise measurement of microscopic surface topography, such as semiconductors, optical devices and other fields.


3D Profilometer: Due to its diverse technical principles, it can be applied to a wider range of scenarios, including three-dimensional topography measurement of macro-objects, reverse engineering, quality inspection and so on.



Measurement Accuracy:


3D White Light Interference Profiler: Accuracy can be achieved down to the nanometer or even sub-nanometer scale. This allows it to excel in applications that require very high measurement accuracy.


3D Profilometer: The accuracy, on the other hand, depends on the specific technology used; in general, the accuracy is at the micron level, but it meets the needs of most industrial inspections.



There are obvious differences between 3D white light interference profilers and 3D profilers in terms of principle, application and measurement accuracy. When choosing which device to use, it is necessary to make comprehensive considerations based on specific measurement needs, budget and working environment.

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