The Difference Between Telephoto Lenses and Microscope Lenses

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2025/09/28

author:adminBOSS

Telephoto lenses and microscope lenses, though both optical imaging devices, exhibit fundamental differences due to their distinct design objectives: the former prioritizes “stable object-image ratio,” while the latter pursues “extreme magnification.”

 

 

 

Imaging Principle:

 

1. Telecentric lenses achieve parallel optical paths through specially positioned apertures: object-side telecentricity places the aperture at the image-side focal plane to eliminate parallax caused by object movement; image-side telecentricity positions the aperture at the object-side focal plane to prevent detector displacement from affecting dimensions. The core principle is “stable scaling.”

 

2. Microscope lenses operate on the principle of conjugate imaging, employing two stages of magnification: the objective lens (forming an inverted, magnified real image) and the eyepiece (further magnifying it into a virtual image). This requires fixed object and image distances. Deviations from the optimal working distance result in blurred images and distorted proportions.

 

 

 

Key Features:

 

1. Telephoto lenses feature long working distances and large depth of field, making them suitable for measuring diverse objects in industrial settings, such as dimensional inspection of large components.

 

2. Microscope lenses have extremely short working distances (millimeter to micrometer range, with high-magnification lenses nearly touching the object) and minimal depth of field (only a few micrometers for high-magnification lenses), capable of producing clear images of only a single layer of the object.

 

 

 

Resolution and Application Vary:

 

1. Telecentric lens resolution determines measurement accuracy, capable of resolving object edges (e.g., 0.01mm gaps), used for mechanical part measurement and PCB solder joint inspection.

 

2. Microscope lens resolution distinguishes microscopic features (e.g., bacteria with 0.5μm spacing), constrained by the Abbe limit, used for cell observation, pathological analysis, and chip circuit inspection.

 

 

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