Semiconductor Chip Inspection: Are Image Measurement Instruments Effective?

Using the POMEAS IMAGE 3 PRO image measuring system, images of the chips are captured via a high-precision camera, and software algorithms are used to measure the chips’ two-dimensional dimensions,......

2026/10/19

author:POMEAS

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Case Study: Inspection of Surface Defects on Chips

Select a 0.55–7.6X continuously variable industrial lens (14X ZOOM LENS) paired with a 5-megapixel color smart microscope camera。...

2026/10/15

author:POMEAS

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What are some successful applications of wafer inspection lenses?

For example: inspecting surface defects on wafers, measuring microscopic patterns and structures, and performing quality inspections of lithography processes. High-resolution microscope lenses or s......

2026/10/14

author:POMEAS

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Telecentric Measurement System: 350mm Metal Shaft Diameter Inspection

POMEAS employs a combined multi-probe solution using two Telecentric Measurement Systems. The two probes are positioned at the measurement zones at both ends of the workpiece; through synchronized ......

2026/09/27

author:POMEAS

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Dual-Spectral | Inspection of the Outer Diameter and Wall Thickness of Transparent Tubes

The dual-spectral fusion algorithm can filter out this type of interference noise and maintain measurement stability. The entire process is non-contact and will not scratch the outer surface of the......

2026/09/24

author:POMEAS

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Dual-Spectral Opposite-Beam Measurement Solution | Film Thickness Measurement Case Study

The dual-spectral opposed-beam solution is easy to install and can be directly integrated into existing production lines, with a short retrofit cycle....

2026/09/22

author:POMEAS

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In-Line Laser Profile Sensor | Case Study: In-Line Inspection of Profile Surfaces

Line laser profile sensors can continuously scan the entire length of a profile, reconstructing its complete 3D shape to enable in-line inspection of flatness, curvature, and cross-sectional profile....

2026/09/21

author:POMEAS

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Line Laser Profile Sensor | Case Study: In-Line Inspection of Height Differences in Components

A line laser captures the entire contour profile in a single scan, providing richer dimensional information and enabling multiple dimensional calculations to be performed simultaneously....

2026/09/17

author:POMEAS

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