Precision Measurement for a New Era in Industry--POMEAS Metric Multi-Sensor Measurement System
The Metric multi-sensor measurement system utilizes advanced optical technology and high-precision sensors to quickly and accurately measure the 3D contours and surface features of a wide range of ......
Advantages of PCB Ceramic Substrate Inspection with Auto Focus System
In the field of electronic packaging, PCB ceramic substrates are widely used because of their excellent performance. In order to ensure its quality and reliability, high-precision inspection techno......
Autofocus system detects advantages of semiconductor chip applications
With the rapid development of science and technology, semiconductor chips have become an indispensable key element of modern society. In order to ensure the performance and quality of the chip, hig......
Laser focus microscope system for inspection of semiconductor parts
The laser focusing microscope system uses a laser beam as an illumination light source to magnify semiconductor parts at high magnification through the microscope head, thus clearly showing the int......
PCB Ceramic Substrate Focus Inspection Program
The POMEAS Focus laser autofocus inspection system plays a key role in the visual inspection of PCB ceramic substrates. It not only realizes high-precision and high-efficiency inspection, but also ......
Focus laser autofocus detection LED chip
In the field of LED chip inspection, with the continuous advancement of technology, the requirements for inspection accuracy and efficiency are getting higher and higher. The POMEAS Focus laser au......
Focus Laser AF Detection Principle
The POMEAS Focus laser autofocus inspection principle combines laser ranging and autofocus technology to achieve high-precision and high-efficiency inspection of LED chips. This principle not only ......
Laser image autofocus microscopy system for inspection of electronic parts
Laser image autofocus microscope system is widely used in electronic parts inspection. It can be used to observe the surface morphology, microstructure and defects of electronic parts, providing an......
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